A telecommunications line interface test system architecture

Author

LaMay, John L. ; Caldwell, Dan C.

Author_Institution

Crystal Semicond. Corp., Austin, TX, USA

fYear

1989

Firstpage

216

Lastpage

221

Abstract

The authors present new test techniques which have been used to develop a high-quality, cost-efficient test module suitable for high-volume testing of T1/PCM-39 line interface devices. This test module is capable of fully testing the key parameters of sophisticated line interface driver/receivers (jitter tolerance, jitter attenuation, and pulse-shape template conformance). Using this module, a 75% reduction in test time was achieved. The test system is being used for production testing of ISDN (integrated services digital network) primary-rate line interface devices

Keywords

ISDN; automatic test equipment; automatic testing; electronic equipment testing; modules; production testing; pulse-code modulation; telecommunication transmission lines; telecommunications computing; wave analysers; waveform analysis; ATE; ISDN; T1/PCM-39 line interface devices; high-volume testing; integrated services digital network; jitter attenuation; jitter tolerance; line interface driver/receivers; primary-rate line interface devices; production testing; pulse-shape template; telecommunications line interface test; test module; Attenuation; Circuit testing; Clocks; Frequency; Jitter; Production systems; Pulse shaping methods; Semiconductor device testing; Shape; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1989. Proceedings. Meeting the Tests of Time., International

Conference_Location

Washington, DC

Type

conf

DOI

10.1109/TEST.1989.82297

Filename

82297