Title :
A telecommunications line interface test system architecture
Author :
LaMay, John L. ; Caldwell, Dan C.
Author_Institution :
Crystal Semicond. Corp., Austin, TX, USA
Abstract :
The authors present new test techniques which have been used to develop a high-quality, cost-efficient test module suitable for high-volume testing of T1/PCM-39 line interface devices. This test module is capable of fully testing the key parameters of sophisticated line interface driver/receivers (jitter tolerance, jitter attenuation, and pulse-shape template conformance). Using this module, a 75% reduction in test time was achieved. The test system is being used for production testing of ISDN (integrated services digital network) primary-rate line interface devices
Keywords :
ISDN; automatic test equipment; automatic testing; electronic equipment testing; modules; production testing; pulse-code modulation; telecommunication transmission lines; telecommunications computing; wave analysers; waveform analysis; ATE; ISDN; T1/PCM-39 line interface devices; high-volume testing; integrated services digital network; jitter attenuation; jitter tolerance; line interface driver/receivers; primary-rate line interface devices; production testing; pulse-shape template; telecommunications line interface test; test module; Attenuation; Circuit testing; Clocks; Frequency; Jitter; Production systems; Pulse shaping methods; Semiconductor device testing; Shape; System testing;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82297
