A stretchable EMI measurement sheet with 8×8 coil array, 2V organic CMOS decoder, and −70dBm EMI detection circuits in 0.18¼m CMOS

This paper present that the electromagnetic interference (emi) is a serious issue degrading the dependability of electronic devices. The issue is complicated by the following technology trends: 1) RF signals and clock pulses of digital ICs are in the same frequency range. 2) The increase of LSI power consumption causes an increase of noise emission. 3) Electronic devices have 3D-structures and packaging is dense. These trends also make the root cause analysis of EMI difficult. For example, it is difficult to find the EMI generation points in electronic devices such as cell-phones and PDAs. To solve the problem, an EMI measurement sheet is proposed, which enables the measurement of the EMI distribution on the surface of the electronic devices by wrapping the devices with a sheet like "furoshikildquo.