• DocumentCode
    1619487
  • Title

    A systematic method for determining soft-failure robustness of a subsystem

  • Author

    Orr, Benjamin ; Maheshwari, Pushp ; Gossner, Harald ; Pommerenke, David ; Stadler, Wolfgang

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    A systematic method for evaluating soft fail robustness of a DUT subsystem is presented and demonstrated on a camera MIPI interface. Two different mobile phone platforms are studied under TLP injection while various methods for extracting failure thresholds and localization are applied. The root cause for the soft-failure threshold discrepancy is left for future work.
  • Keywords
    electrostatic discharge; mobile radio; reliability; DUT subsystem; TLP injection; camera MIPI interface; mobile phone; soft-failure robustness; soft-failure threshold discrepancy; Cameras; Probes; Pulse measurements; Robustness; Software; Testing; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6635923
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1619487