Title :
Powered system-level conductive TLP probing method for ESD/EMI hard fail and soft fail threshold evaluation
Author :
Schwingshackl, Thomas ; Orr, Benjamin ; Willemen, Joost ; Simburger, Werner ; Gossner, Harald ; Bosch, Wolfgang ; Pommerenke, David
Author_Institution :
Infineon Technol. AG, Neubiberg, Germany
Abstract :
In this paper an advanced system-level TLP probing technique is presented to evaluate the ESD and EMI performance of a powered system applicable to high speed interfaces. It allows to detect hardware and software fail thresholds to assess the performance of an ESD/EMI protection solution. The method is demonstrated on a Intel mobile phone reference platform.
Keywords :
electromagnetic interference; electrostatic discharge; hardware-software codesign; ESD/EMI protection solution; Intel mobile phone reference platform; fail thresholds; hard fail; high speed interfaces; soft fail; system-level conductive TLP probing method; threshold evaluation; Capacitance; Current measurement; Electrostatic discharges; Impedance; Insertion loss; Probes; Transmission line measurements;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
