Title :
Point to point ESD protection network, a flexible and competitive strategy demonstrated in advanced CMOS technology
Author :
Guitard, Nicolas ; Bourgeat, Johan ; Dray, Alexandre ; Troussier, Ghislain ; Jimenez, Joaquin ; Galy, Ph
Author_Institution :
STMicroelectron., Crolles, France
Abstract :
This paper presents a novel self-protected IO concept based on a compact 3 ports ESD protection device. Advantages compared to other ESD protection networks are demonstrated: compactness, flexibility and lower leakage. ESD demonstrators are processed in advanced CMOS to validate this concept, description and ESD results are presented.
Keywords :
CMOS integrated circuits; electrostatic devices; electrostatic discharge; advanced CMOS technology; compact 3 port ESD protection device; point to point ESD protection network; self-protected IO concept; CMOS integrated circuits; Clamps; Electrostatic discharges; Logic gates; Power supplies; Rails; Thyristors;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
