DocumentCode
1619532
Title
Point to point ESD protection network, a flexible and competitive strategy demonstrated in advanced CMOS technology
Author
Guitard, Nicolas ; Bourgeat, Johan ; Dray, Alexandre ; Troussier, Ghislain ; Jimenez, Joaquin ; Galy, Ph
Author_Institution
STMicroelectron., Crolles, France
fYear
2013
Firstpage
1
Lastpage
10
Abstract
This paper presents a novel self-protected IO concept based on a compact 3 ports ESD protection device. Advantages compared to other ESD protection networks are demonstrated: compactness, flexibility and lower leakage. ESD demonstrators are processed in advanced CMOS to validate this concept, description and ESD results are presented.
Keywords
CMOS integrated circuits; electrostatic devices; electrostatic discharge; advanced CMOS technology; compact 3 port ESD protection device; point to point ESD protection network; self-protected IO concept; CMOS integrated circuits; Clamps; Electrostatic discharges; Logic gates; Power supplies; Rails; Thyristors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location
Las Vegas, NV
ISSN
0739-5159
Type
conf
Filename
6635925
Link To Document