Title :
A simulation of 3-axis magnetotransistor based on the carrier recombination — Deflection effect
Author :
Phetchakul, T. ; Muangthong, Samudchad ; Leepattarapongpan, Chana ; Poyai, Amporn
Author_Institution :
Dept. of Electron., King Mongkut´s Inst. of Technol. Ladkrabang, Bangkok, Thailand
Abstract :
This article presents 3 axis magnetotransistor based on the carrier recombination and deflection effect for detecting the magnetic field in BX, BY and BZ direction. The structure composes of four magnetotransistors along with x-axis and y-axis that has a common emitter while all collectors and bases are independent. The output is in the form of difference current of collector and base ΔICB. For vertical field detection, the magnetotransistor uses the carrier deflection of the deviation collector current and recombination base current as ΔICB. For lateral field detection BX and BY it uses a pair of transistors that emitter biased current perpendicular to magnetic field. The output response is the difference current between collector of one and the base current of the another of a pair transistors as ΔIC(1)B(3) and ΔIC(2)B(4) for BX and By, respectively. The sensitivity at IE 5 mA, 0-1 T of BX, BY and BZ direction are -0.0248 mA/T, -0.0248 mA/T and 0.0092 mA/T, respectively by TCAD Sentaurus simulation.
Keywords :
bipolar transistors; electron-hole recombination; magnetic devices; magnetic field measurement; magnetic sensors; carrier recombination; deflection effect; deviation collector current; emitter biased current; magnetic field; recombination base current; three-axis magnetotransistor; vertical field detection; Magnetic field measurement; Magnetic separation; Magnetic tunneling; Magnetometers; Spontaneous emission; Transistors; 3-axis; TCAD Sentaurus; carrier deflection; carrier recombination; magnetotransistor;
Conference_Titel :
Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), 2014 11th International Conference on
Conference_Location :
Nakhon Ratchasima
DOI :
10.1109/ECTICon.2014.6839815