DocumentCode :
16198
Title :
Semi-Markov Process-Based Integrated Importance Measure for Multi-State Systems
Author :
Hongyan Dui ; Shubin Si ; Zuo, Ming J. ; Shudong Sun
Author_Institution :
Sch. of Manage. Eng., Zhengzhou Univ., Zhengzhou, China
Volume :
64
Issue :
2
fYear :
2015
fDate :
Jun-15
Firstpage :
754
Lastpage :
765
Abstract :
Importance measures in reliability engineering are used to identify weak components of a system and signify the roles of components in contributing to proper functioning of the system. Recently, an integrated importance measure (IIM) has been proposed to evaluate how the transition of component states affects the system performance based on the probability distributions and transition rates of component states. In the system operation phase, the bathtub curve presents the change of the transition rate of component states with time, which can be described by three different Weibull distributions. The behavior of a system under such distributions can be modeled by the semi-Markov process. So, based on the reported IIM equations of component states, this paper studies how the transition of component states affects system performance under the semi-Markov process. This measure can provide useful information for preventive actions (such as monitoring enhancement, construction improvement, etc.), and provide support to improve system performance. Finally, a simple numerical example is presented to illustrate the utilization of the proposed method.
Keywords :
Markov processes; Weibull distribution; reliability theory; IIM equations; Weibull distributions; bathtub curve; component states; multistate systems; preventive actions; probability distributions; reliability engineering; semiMarkov process-based integrated importance measure; system operation phase; system performance improvement; transition rates; weak-component identification; Maintenance engineering; Markov processes; Mathematical model; Reliability; Silicon; System performance; Component state; importance measure; multi- state system; semi-Markov processes;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2015.2413031
Filename :
7080918
Link To Document :
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