Title :
Activities towards a new transient latch-up standard
Author :
Stadler, Wolfgang ; Ashton, Robert ; Domanski, Krzysztof ; Gauthier, R. ; Henry, Leo G. ; Meuse, Tom ; Peachey, Nathaniel ; Reinprecht, Wolfgang ; Righter, Alan ; Voldman, Steven
Author_Institution :
DSI, Intel Mobile Commun., Neubiberg, Germany
Abstract :
This contribution summarizes the latest Technical Report of the ANSI/ESDA Working Group 5.4 Transient Latch-up (TLU). 18 case studies are described and classified with respect to occurrence of the TLU, trigger, and sensitivity to static latch-up tests. Based on the classification, next steps towards a TLU test methodology are discussed.
Keywords :
ANSI standards; electrostatic discharge; integrated circuit design; integrated circuit reliability; integrated circuit testing; transients; ANSI/ESDA working group 5.4; TLU; static latch-up tests; technical report; transient latch-up standard; Clamps; Electrostatic discharges; Integrated circuits; Stress; Substrates; Thyristors; Transient analysis;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
