Title :
The very unusual case of the IEC-robust IC with low HBM performance
Author :
Boselli, G. ; Brodsky, Jonathan
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
In this work we will show for the first time the case of an IC robust to on-chip IEC 61000-4-2 ESD level events and, yet, consistently failing at low HBM levels (<;2KV). The causes for the miscorrelation will be investigated in detail. A more reliable indicator for HBM robustness will be indicated.
Keywords :
IEC standards; electrostatic discharge; HBM performance; IEC-robust IC; on-chip IEC 61000-4-2 ESD level events; Capacitance; Clamps; Electrostatic discharges; IEC; IEC standards; Logic gates;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
