DocumentCode
1619929
Title
System level EOS case studies not due to excessive voltages
Author
Wong, Rita ; Shi-Jie Wen ; Fung, Rita ; Le, Paul
Author_Institution
Cisco Syst. Inc., San Jose, CA, USA
fYear
2013
Firstpage
1
Lastpage
6
Abstract
EOS has been a dominant failure mode. Recent efforts to determine root causes have focused on voltages that have exceeded a safe operating limit. Case studies will be presented that show EOS failures where the root cause is not excessive voltages.
Keywords
failure analysis; integrated circuit reliability; integrated circuit testing; EOS failures; dominant failure mode; electrical over stress; safe operating limit; system level EOS; Clamps; Earth Observing System; Electrostatic discharges; Failure analysis; Heating; Metals; Power supplies;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location
Las Vegas, NV
ISSN
0739-5159
Type
conf
Filename
6635938
Link To Document