Title :
Engineering curricular for `meeting the tests of time´
Author :
Absher, Richard ; Lecky, J.E.
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Vermont Univ., Burlington, VT, USA
Abstract :
The authors describe a background study, course developments, and concepts for a curriculum in electronics test engineering. Their conclusion is that appropriate academic programs in electronics test engineering should be developed at the B.S., M.S., and Ph.D levels. The identification of the common background and education, as well as the implementation, of these programs requires strong university/industry cooperation and support. As exemplified by the present study, this process can occur at the local level. However, it is suggested that a broader input and a greater visibility are warranted, and it is recommenced that an organization such as the Test Technology Technical Committee coordinate the development of model curricula for `meeting the tests of time´
Keywords :
educational courses; electronic equipment testing; instrumentation; integrated circuit testing; B.S.; M.S.; Ph.D; Test Technology Technical Committee; academic programs; curriculum; education; educational courses; electronics test engineering; university/industry cooperation; Automatic testing; Circuit testing; Design for testability; Electrical fault detection; Electronic equipment testing; Error correction codes; Fault detection; Integrated circuit testing; Logic design; Logic testing;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82300
