DocumentCode :
1620058
Title :
Pattern recognition-a technique for induction machines rotor fault detection "eccentricity and broken bar fault"
Author :
Haji, Masoud ; Toliyat, Hamid A.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Volume :
3
fYear :
2001
Firstpage :
1572
Abstract :
A pattern recognition technique based on Bayes minimum error classifier is developed to detect broken rotor bar faults and static eccentricity in induction motors at the steady state. The proposed algorithm uses stator currents as input without any other sensors. First, rotor speed is estimated from stator currents, then appropriate features are extracted. The produced feature vector is normalized and fed to the trained Bayes minimum error classifier to determine if motor is healthy or has incipient faults (broken bar fault, static eccentricity or both). Only number of poles and rotor slots are needed as pre-knowledge information. Theoretical approach together with experimental results derived from a 3 hp AC induction motor show the strength of this method. In order to cover many different motor load conditions data are derived from 10% to 130% of the rated load for both a healthy induction motor and an induction motor with a rotor having 4 broken bars and/or static eccentricity.
Keywords :
Bayes methods; error analysis; fault location; feature extraction; induction motors; parameter estimation; rotors; 3 hp; AC induction motor; Bayes minimum error classifier; broken bar fault; broken bars; broken rotor bar faults detection; eccentricity; feature vector normalization; induction machines; motor load conditions; number of poles; pattern recognition; rotor fault detection; rotor slots; rotor speed estimation; rotor static eccentricity detection; stator current estimation; trained Bayes minimum error classifier; Bars; Data mining; Fault detection; Feature extraction; Induction machines; Induction motors; Pattern recognition; Rotors; Stators; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-7114-3
Type :
conf
DOI :
10.1109/IAS.2001.955745
Filename :
955745
Link To Document :
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