• DocumentCode
    1620094
  • Title

    A new look at the financial impact of air ionization

  • Author

    Gumkowski, Gregory ; Levit, Lawrence

  • Author_Institution
    NRD LLC, Grand Island, NY, USA
  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The use of air ionization in semiconductor manufacturing has been shown to reduce micro-contamination [1,2,3,4] and improve process yield >0.2%. However, when used within a mini-environment the need for periodic cleaning and calibration results in downtime and tool unavailability. For some processes in mini-environments, this loss exceeds the yield enhancements. This paper estimates the effective yield loss at 0.58% for processes requiring considerable ionizer maintenance and recommends the use of non-corona ionizers for those processes known to exhibit a high rate of emitter point debris collection.
  • Keywords
    calibration; contamination; corona; ionisation; losses; semiconductor device manufacture; air ionization; calibration; emitter point debris collection; financial impact; ionizer maintenance; microcontamination; minienvironment; noncorona ionizers; periodic cleaning; process yield; semiconductor manufacturing; yield enhancements; yield loss; Availability; Cleaning; Corona; Ionization; Maintenance engineering; Manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6635945