DocumentCode :
1620094
Title :
A new look at the financial impact of air ionization
Author :
Gumkowski, Gregory ; Levit, Lawrence
Author_Institution :
NRD LLC, Grand Island, NY, USA
fYear :
2013
Firstpage :
1
Lastpage :
6
Abstract :
The use of air ionization in semiconductor manufacturing has been shown to reduce micro-contamination [1,2,3,4] and improve process yield >0.2%. However, when used within a mini-environment the need for periodic cleaning and calibration results in downtime and tool unavailability. For some processes in mini-environments, this loss exceeds the yield enhancements. This paper estimates the effective yield loss at 0.58% for processes requiring considerable ionizer maintenance and recommends the use of non-corona ionizers for those processes known to exhibit a high rate of emitter point debris collection.
Keywords :
calibration; contamination; corona; ionisation; losses; semiconductor device manufacture; air ionization; calibration; emitter point debris collection; financial impact; ionizer maintenance; microcontamination; minienvironment; noncorona ionizers; periodic cleaning; process yield; semiconductor manufacturing; yield enhancements; yield loss; Availability; Cleaning; Corona; Ionization; Maintenance engineering; Manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
ISSN :
0739-5159
Type :
conf
Filename :
6635945
Link To Document :
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