DocumentCode
1620333
Title
Spanning tree seams for reducing parameterization distortion of triangulated surfaces
Author
Sheffer, Alla
Author_Institution
Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa, Israel
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
61
Lastpage
68
Abstract
Providing a two-dimensional parameterization of three-dimensional tessellated surfaces is beneficial to many applications in computer graphics, finite-element surface meshing, surface reconstruction and other areas. The applicability of the parameterization depends on how well it preserves the surface metric structures (angles, distances, areas). For a general surface there is no mapping which fully preserves these structures. The distortion usually increases with the rise in surface complexity. For highly complicated surfaces the distortion can become so strong as to make the parameterization unusable for application purposes. One possible solution is to subdivide the surface or introduce seams in a way which will reduce the distortion. This article presents a new method for introduction of seams in three-dimensional tessellated surfaces. The addition of seams reduces the surface complexity and hence reduces the metric distortion produced by the parameterization. Seams often introduce additional constraints on the application for which the parameterization is used, hence their length should be minimal. The new method presented minimizes the seam length while reducing the parameterization distortion
Keywords
computational geometry; mesh generation; solid modelling; trees (mathematics); 3D tessellated surfaces; computer graphics; finite-element surface meshing; parameterization distortion; spanning tree seams; surface complexity; surface metric structures; surface reconstruction; three dimensional tessellated surfaces; triangulated surfaces; two-dimensional parameterization; Application software; Computer graphics; Finite element methods; Image reconstruction; Law; Legal factors; Mesh generation; Surface reconstruction; Surface texture; Tree graphs;
fLanguage
English
Publisher
ieee
Conference_Titel
Shape Modeling International, 2002. Proceedings
Conference_Location
Banff, Alta.
Print_ISBN
0-7695-1546-0
Type
conf
DOI
10.1109/SMI.2002.1003529
Filename
1003529
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