Title :
Chip-level electro-thermal simulation of bipolar transistor circuits
Author :
Moinian, Shahriar ; Feldmann, Peter ; Melville, Robert C.
Author_Institution :
AT&T Bell Labs., Reading, PA, USA
Abstract :
This paper presents accurate electro-thermal circuit-level modeling of both self and mutual heating for bipolar transistor IC devices. In addition, thermal transmission line network models are used to characterize the important mutual heating among devices on a chip. The models have been implemented in a new electro-thermal analog circuit simulator, Sframe, with robust convergence due to parameter continuation methodology
Keywords :
integrated circuit modelling; IC devices; Sframe; analog circuit simulator; bipolar transistor circuits; chip-level simulation; circuit-level modeling; electro-thermal simulation; mutual heating; parameter continuation methodology; robust convergence; self heating; thermal transmission line network models; Bipolar transistor circuits; Circuit simulation; Coupling circuits; Heat sinks; Heat transfer; Heating; Integrated circuit modeling; MOSFETs; Predictive models; Temperature dependence;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting,1994., Proceedings of the 1994
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-1316-X
DOI :
10.1109/BIPOL.1994.587877
