DocumentCode :
1620630
Title :
Table of contents
fYear :
2013
Abstract :
Presents the table of contents of the proceedings record.
Keywords :
CMOS integrated circuits; CMOS technology; Educational institutions; Electrostatic discharges; Mobile communication; System-on-chip; Thyristors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV, USA
ISSN :
0739-5159
Type :
conf
Filename :
6635962
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1620630