Title :
Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting
Abstract :
The following topics are dealt with: interconnect technology; device physics; process design; advanced transistor technologies; analog circuits; circuit modeling; bipolar process integration; digital BiCMOS applications; compact modeling and parameter extraction; device reliability; digital bipolar design; and thermal effects
Keywords :
bipolar integrated circuits; BiCMOS circuits; advanced transistor technologies; analog circuits; bipolar circuits; bipolar process integration; circuit modeling; compact modeling; device physics; device reliability; digital BiCMOS applications; digital bipolar design; interconnect technology; parameter extraction; process design; thermal effects;
Conference_Titel :
Bipolar/BiCOMS Circuits and Technology Meeting, 1993., Proceedings of the 1993
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-1316-X
DOI :
10.1109/BIPOL.1993.617457
