Title :
State-of-the-art microwave device characterization using large-signal network analyzers
Author :
Myslinski, Maciej ; Pailloncy, Guillaume ; Avolio, Gustavo ; Verbeyst, Frans ; Vanden Bossche, Marc ; Schreurs, Dominique
Author_Institution :
Div. ESAT-Telemic, K. U. Leuven, Leuven, Belgium
Abstract :
This paper presents a snapshot of key large-signal network analysis capabilities enabling state-of-the-art microwave device characterization. An overview of different large-signal network analyzer configurations with the source- and load-pull techniques is given. Next, we report on the modulation capabilities that allow the characterization of high- and low-frequency effects which occur typically in active devices for wireless communication applications.
Keywords :
microwave devices; network analysis; active devices; large-signal network analyzers; load-pull techniques; modulation capabilities; source-pull techniques; state-of-the-art microwave device characterization; wireless communication applications; Integrated circuits; Microwave devices; large-signal network analysis; microwave measurements; nonlinear circuits; nonlinear distortion; time-domain measurements;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2010 Proceedings of the 17th International Conference
Conference_Location :
Warsaw
Print_ISBN :
978-1-4244-7011-2
Electronic_ISBN :
978-83-928756-4-2
