Title :
The limiting performance of a CMOS bistable register based on waveform considerations
Author :
Friedman, Eby G.
Author_Institution :
Dept. of Electr. Eng., Rochester Univ., NY, USA
Abstract :
Closed-form solutions describing the output response of a CMOS bistable register are presented. From these results, the fundamental latching behavior of a CMOS register is developed in terms of its physical and circuit characteristics. Necessary and sufficient conditions for latching data are described in terms of small signal circuit parameters. From these necessary and sufficient conditions, the limiting condition for latching and the onset of metastability are presented and verified
Keywords :
CMOS integrated circuits; equivalent circuits; integrated logic circuits; stability; transient response; CMOS; bistable register; latching behavior; limiting performance; metastability; output response; small signal circuit parameters; waveform; Clocks; Closed-form solution; Coupling circuits; Latches; Metastasis; Random access memory; Registers; Shape; Sufficient conditions; Voltage;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271315
