Title :
A pragmatic, systematic and flexible synthesis for testability methodology
Author :
Alves, Vladimir Castro ; Antunes, A. Ribeiro ; Marzouki, Meryem
Author_Institution :
COPPE, Univ. Fed. do Rio de Janeiro, Brazil
Abstract :
Starting from the analysis of the most widely adopted methodologies and the most successful industrial tools in the fields of HLS and DFT, this paper proposes a general framework for a pragmatic, systematic and flexible SFT methodology. The prerequisites for such a methodology, together with the state of the art are first assessed, then an overview of the approach is presented, followed by step-by-step details through a case-study of High-Level Synthesis For BIST. Examples of first obtained results are also provided
Keywords :
automatic testing; boundary scan testing; built-in self test; design for testability; high level synthesis; logic testing; AMICAL synthesis; BIST; BUS-based circuit; automatic generation; data path; design for testability; embedded test paths; high-level synthesis for testability; industrial tools; pragmatic synthesis; programmable test pattern generation; scan path; systematic flexible synthesis; testability methodology; Automatic testing; Built-in self-test; Constraint optimization; Control system synthesis; Design for testability; Design optimization; High level synthesis; Libraries; Network synthesis; System testing;
Conference_Titel :
Test Symposium, 1996., Proceedings of the Fifth Asian
Conference_Location :
Hsinchu
Print_ISBN :
0-8186-7478-4
DOI :
10.1109/ATS.1996.555169
