• DocumentCode
    1621690
  • Title

    Long lossy lines (L3) and their impact upon large chip performance

  • Author

    Davidson, Evan ; McCredie, Bradley ; Vilkelis, Walter

  • Author_Institution
    IBM Corp., Poughkeepsie, NY, USA
  • fYear
    1998
  • Firstpage
    28
  • Lastpage
    38
  • Abstract
    The semiconductor industry expects the performance of microprocessors to continue at its current rate of improvement, i.e. clock rates should double every two to three years. This is a commendable goal, but it is also fair to question whether this is an achievable goal. The fundamental problem is that as ground rules are reduced, the natural tendency is to make smaller conductor cross-sectional areas. The result is a high resistance line that exhibits slow wave propagation effects (Ho et al, 1982). This reduces the general performance expectations. As circuits become faster and denser on the chip, line delays become greater than expected. This problem is analyzed and potential chip and packaging solutions are offered. Clock rate predictions for various design and process options are made. A tactical recommendation to consider a total packaged electronics solution is presented
  • Keywords
    delays; electric resistance; integrated circuit design; integrated circuit interconnections; integrated circuit metallisation; integrated circuit packaging; integrated circuit reliability; microprocessor chips; chip performance; circuit density; circuit speed; clock rates; conductor cross-sectional area; design options; ground rule reduction; high resistance line; line delays; long lossy lines; microprocessors; packaging; process options; semiconductor industry; slow wave propagation effects; total packaged electronics solution; Application specific integrated circuits; Clocks; Conductors; Hip; History; Integrated circuit technology; Microcomputers; Microprocessors; Performance loss; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IC/Package Design Integration, 1998. Proceedings. 1998 IEEE Symposium on
  • Conference_Location
    Santa Cruz, CA
  • Print_ISBN
    0-8186-8433-X
  • Type

    conf

  • DOI
    10.1109/IPDI.1998.663616
  • Filename
    663616