Title :
Hardware-based weighted random pattern generation for boundary scan
Author :
Brglez, Franc ; Gloster, Clay ; Kedem, Gershon
Author_Institution :
Microelectron. Center of North Carolina, Research Triangle Park, NC, USA
Abstract :
The authors introduce WARP, a weighted test generation system that includes a canonical circuit for resolving weights to any desired precision. Either cellular automata registers (CARs) or linear feedback shift registers (LFSRs) are used as a source of random patterns, and optionally, it is possible to permute and linearly combine random bits from the source to control inputs to the weighting circuit. The authors analyze pattern coverage and conclude with benchmark results on fault coverage differences between CARs and LFSRs
Keywords :
automatic test equipment; finite automata; logic testing; random processes; shift registers; ATE; WARP; boundary scan; canonical circuit; cellular automata registers; fault coverage; linear feedback shift registers; logic testing; pattern coverage; weighted random pattern generation; Benchmark testing; Circuit faults; Circuit testing; Hardware; Legged locomotion; Linear feedback shift registers; Microelectronics; Performance evaluation; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82307
