DocumentCode
1622026
Title
Seamless high off-chip connectivity [IC packaging]
Author
Schaper, Leonard ; Dibbs, Mitchell ; Garrou, Phil ; Chau, CC ; So, Ying ; Frye, Donald ; Wagner, John ; Ousley, Joe ; Baugher, Greg ; Picard, Rick ; Connor, Gary ; Winn, Dave ; Deane, Phil ; Eden, Richard ; Sands, Randall
Author_Institution
Arkansas Univ., Fayetteville, AR, USA
fYear
1998
Firstpage
39
Lastpage
44
Abstract
Seamless high off-chip connectivity (SHOCC) is a combined packaging, interconnect, and IC design philosophy based on a wire hierarchy distributed between the active die and a passive interconnection substrate. SHOCC takes a system level view of the chip, package and substrate requirements to shift the device fabrication paradigm from the current single die approach to a parallel manufacturing scheme which is expected to provide a system with better performance and lower cost. The SHOCC Consortium is conducting a coordinated technology research and development project to assess the potential value of SHOCC, define and develop the process technologies and materials needed to implement SHOCC, and demonstrate the value of SHOCC in real parts and systems. This paper describes the SHOCC concept and details the current status of the technology
Keywords
integrated circuit design; integrated circuit interconnections; integrated circuit manufacture; integrated circuit packaging; IC design; IC interconnect; IC packaging; SHOCC; SHOCC Consortium; SHOCC materials; active die; device fabrication paradigm; package; parallel manufacturing scheme; passive interconnection substrate; process technology; seamless high off-chip connectivity; system cost; system level approach; system performance; wire hierarchy; Chemical technology; Costs; Dielectric loss measurement; Fabrication; Integrated circuit interconnections; Integrated circuit packaging; Manufacturing; Semiconductor device manufacture; Substrates; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
IC/Package Design Integration, 1998. Proceedings. 1998 IEEE Symposium on
Conference_Location
Santa Cruz, CA
Print_ISBN
0-8186-8433-X
Type
conf
DOI
10.1109/IPDI.1998.663617
Filename
663617
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