Title :
A unified formula for K-terminal reliability analysis in ring networks
Author :
Yin, Jiahnsheng ; Silio, Charles B., Jr.
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Abstract :
A formula that uses K-minimal Eulerian circuits and the inclusion-exclusion property to efficiently compute K-terminal reliability RK(G) for ring networks is presented. This formula is applied to three fiber distributed data interface (FDDI) ring network topologies, and it is shown that the time complexity of computing each K-terminal reliability expression is polynomially bounded. The applicability of the authors´ approach is illustrated by deriving a closed-form expression of RK (G) for the FDDI double-ring topology in terms of the failure probabilities of links, network ports, and station common units
Keywords :
FDDI; computational complexity; network topology; reliability theory; token networks; FDDI topologies; K-minimal Eulerian circuits; K-terminal reliability analysis; closed-form expression; double-ring topology; failure probabilities; inclusion-exclusion property; links; network ports; polynomially bounded; ring networks; station common units; time complexity; unified formula; Computer interfaces; Computer networks; Counting circuits; Distributed computing; FDDI; Intelligent networks; Network topology; Polynomials; Switches; Telecommunication network reliability;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271351
