DocumentCode :
1622528
Title :
Yield measurement tests sites
Author :
Satya, Akella V S
Author_Institution :
IBEM, Hopewell Junction, NY, USA
fYear :
1990
Firstpage :
141
Lastpage :
144
Abstract :
The IBM East Fishkill Facility uniquely utilizes the yield management test sites (YMTSs) as the basis for all of its accelerated yield learning. The author reviews the evolution of the YMTS to the improvements required to ensure rapid root-cause analysis and timely corrective actions. The YMTS data analysis, which reveals a high correlation between the predicted and the actual product final test yields, and the design criteria that helped achieve it are discussed. The success of the YMTS in predicting the job-by-job final test yields of the product has been demonstrated. A few design and model enhancements are identified as the pivotal contributors to this success. The current state of the art in test site design is also briefly introduced
Keywords :
integrated circuit manufacture; integrated circuit testing; production testing; IBM East Fishkill Facility; YMTS; accelerated yield learning; design criteria; model enhancements; root-cause analysis; test site design; yield management test sites; Acceleration; Contamination; Inspection; Large scale integration; Logistics; Monitoring; Pollution measurement; Testing; Visual databases; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1991. ICMTS 1991. Proceedings of the 1991 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
0-87942-588-1
Type :
conf
DOI :
10.1109/ICMTS.1990.161728
Filename :
161728
Link To Document :
بازگشت