DocumentCode
1623096
Title
Output buffer with self-adjusting slew rate and on-chip compensation
Author
Lim, Chee How ; Daasch, W. Robert
Author_Institution
Portland Technol. Dev., Intel Corp., USA
fYear
1998
Firstpage
51
Lastpage
55
Abstract
In this paper, two circuits are proposed to effectively control IC noise. The first circuit is a modified I/O circuit that monitors the local output switching condition, and intelligently adjusts its slew rate such that the I/O can switch as fast as it is allowed without jeopardizing noise performance. The second circuit is a PVT-compensation control circuit, which senses process, voltage, and temperature variations, and compensates the I/O circuit´s current drive accordingly. This feature makes the I/O circuits more robust under a range of environmental stresses. From analyses and simulations, the proposed I/O and PVT-compensation control circuits demonstrate robustness in terms of IC noise control. They control IC noise to less than 10% variation between single and multiple output switchings as compared to a conventional I/O circuit with 56% variation
Keywords
buffer circuits; circuit analysis computing; compensation; integrated circuit design; integrated circuit modelling; integrated circuit noise; switching; I/O circuit; I/O circuit current drive compensation; I/O circuits; I/O switching speed; IC noise control; IC noise control circuits; PVT-compensation control circuit; environmental stresses; local output switching condition monitoring; modified I/O circuit; multiple output switching; noise performance; on-chip compensation; output buffer; process variations; self-adjusting slew rate; single output switching; slew rate; temperature variations; voltage variations; Analytical models; Integrated circuit noise; Noise robustness; Stress; Switches; Switching circuits; Temperature control; Temperature sensors; Voltage control; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
IC/Package Design Integration, 1998. Proceedings. 1998 IEEE Symposium on
Conference_Location
Santa Cruz, CA
Print_ISBN
0-8186-8433-X
Type
conf
DOI
10.1109/IPDI.1998.663621
Filename
663621
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