DocumentCode :
1623096
Title :
Output buffer with self-adjusting slew rate and on-chip compensation
Author :
Lim, Chee How ; Daasch, W. Robert
Author_Institution :
Portland Technol. Dev., Intel Corp., USA
fYear :
1998
Firstpage :
51
Lastpage :
55
Abstract :
In this paper, two circuits are proposed to effectively control IC noise. The first circuit is a modified I/O circuit that monitors the local output switching condition, and intelligently adjusts its slew rate such that the I/O can switch as fast as it is allowed without jeopardizing noise performance. The second circuit is a PVT-compensation control circuit, which senses process, voltage, and temperature variations, and compensates the I/O circuit´s current drive accordingly. This feature makes the I/O circuits more robust under a range of environmental stresses. From analyses and simulations, the proposed I/O and PVT-compensation control circuits demonstrate robustness in terms of IC noise control. They control IC noise to less than 10% variation between single and multiple output switchings as compared to a conventional I/O circuit with 56% variation
Keywords :
buffer circuits; circuit analysis computing; compensation; integrated circuit design; integrated circuit modelling; integrated circuit noise; switching; I/O circuit; I/O circuit current drive compensation; I/O circuits; I/O switching speed; IC noise control; IC noise control circuits; PVT-compensation control circuit; environmental stresses; local output switching condition monitoring; modified I/O circuit; multiple output switching; noise performance; on-chip compensation; output buffer; process variations; self-adjusting slew rate; single output switching; slew rate; temperature variations; voltage variations; Analytical models; Integrated circuit noise; Noise robustness; Stress; Switches; Switching circuits; Temperature control; Temperature sensors; Voltage control; Working environment noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IC/Package Design Integration, 1998. Proceedings. 1998 IEEE Symposium on
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-8433-X
Type :
conf
DOI :
10.1109/IPDI.1998.663621
Filename :
663621
Link To Document :
بازگشت