Title :
Comparison of direct tunneling in Metal-GaN Schottky junctions using different k⃗ · p⃗ models for the complex bandstructure
Author :
Daka, Bharath ; Ajoy, Arvind ; Karmalkar, Shreepad
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India
Abstract :
In this work, we study the phenomenon of Direct Tunneling(DT) in Metal-nGaN Schottky junctions. We first compare tunneling current densities computed using quantum (NEGF) and the semi-classical (WKB) transport formulations, based on a single band parabolic approximation to the complex GaN bandstructure. We then estimate current densities using the WKB transport formulation, with complex bandstructures extracted from the two band k⃗ · p⃗ and four band k⃗ · p⃗ theories of the wurtzite GaN. We find that a WKB transport formulation is quite reliable for low bias values. We also find that the use of multi-band k⃗ · p⃗ models for calculating tunneling effective mass is necessary to estimate tunneling current densities accurately.
Keywords :
Green´s function methods; III-V semiconductors; Schottky barriers; WKB calculations; band structure; current density; effective mass; gallium compounds; k.p calculations; semiconductor-metal boundaries; tunnelling; wide band gap semiconductors; NEGF; WKB transport formulation; complex GaN bandstructure; direct tunneling; four band k⃗ · p⃗ theory; low bias values; metal-nGaN Schottky junctions; multiband k⃗ · p⃗ models; nonequilibrium Green´s function method; quantum transport formulation; semiclassical transport formulation; single band parabolic approximation; tunneling current densities; tunneling current density; tunneling effective mass; wurtzite GaN; Approximation methods; Computational modeling; Current density; Effective mass; Gallium nitride; Junctions; Tunneling; Direct tunneling; NEGF; Schottky junctions; WKB; complex bandstructure;
Conference_Titel :
Emerging Electronics (ICEE), 2012 International Conference on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4673-3135-7
DOI :
10.1109/ICEmElec.2012.6636234