DocumentCode
16239
Title
Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design
Author
Yuan-Hao Chang ; Po-Chun Huang ; Pei-Han Hsu ; Lee, Lue-Jane ; Tei-Wei Kuo ; Du, David Hung-Chang
Author_Institution
Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Volume
62
Issue
12
fYear
2013
fDate
Dec. 2013
Firstpage
2503
Lastpage
2515
Abstract
In recent years, reliability has become one critical issue in the designs of flash-memory file/storage systems, due to the growing unreliability of advanced flash-memory chips. In this paper, a version-based design is proposed to effectively and efficiently maintain the consistency among page versions of a file for potential recovery needs. In particular, a two-version one for a native file system is presented with the minimal overheads in version maintenance. A recovery scheme is then presented to restore a corrupted file back to the latest consistent version. The design is later extended to maintain multiple data versions with the considerations of the write constraints of multilevel-cell flash memory. It was shown that the proposed design could significantly improve the reliability of flash memory with limited management and space overheads.
Keywords
Poisson distribution; flash memories; reliability; advanced flash-memory chips; corrupted file; flash-memory storage systems; management overheads; multilevel-cell flash memory; multiple data versions; native file system; page versions; reliability enhancement; space overheads; version maintenance; version-based design; Computer architecture; Error correction codes; Flash memory; Queueing analysis; Reliability engineering; Storage management; ECC; Flash memory; MLC; Poisson distribution; YAFFS; binomial distribution; file system; forward copying; queue; recovery; reliability; two version;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.2012.131
Filename
6212465
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