Title :
Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design
Author :
Yuan-Hao Chang ; Po-Chun Huang ; Pei-Han Hsu ; Lee, Lue-Jane ; Tei-Wei Kuo ; Du, David Hung-Chang
Author_Institution :
Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Abstract :
In recent years, reliability has become one critical issue in the designs of flash-memory file/storage systems, due to the growing unreliability of advanced flash-memory chips. In this paper, a version-based design is proposed to effectively and efficiently maintain the consistency among page versions of a file for potential recovery needs. In particular, a two-version one for a native file system is presented with the minimal overheads in version maintenance. A recovery scheme is then presented to restore a corrupted file back to the latest consistent version. The design is later extended to maintain multiple data versions with the considerations of the write constraints of multilevel-cell flash memory. It was shown that the proposed design could significantly improve the reliability of flash memory with limited management and space overheads.
Keywords :
Poisson distribution; flash memories; reliability; advanced flash-memory chips; corrupted file; flash-memory storage systems; management overheads; multilevel-cell flash memory; multiple data versions; native file system; page versions; reliability enhancement; space overheads; version maintenance; version-based design; Computer architecture; Error correction codes; Flash memory; Queueing analysis; Reliability engineering; Storage management; ECC; Flash memory; MLC; Poisson distribution; YAFFS; binomial distribution; file system; forward copying; queue; recovery; reliability; two version;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.2012.131