• DocumentCode
    1624507
  • Title

    Investigating Mechanical Behavior of LGA Sockets for Design by FEA Modeling

  • Author

    Imaninejad, Mehdi ; Zheng, Tieyu ; Xie, Hong

  • Author_Institution
    Intel Corp., Chandler, AZ
  • fYear
    2008
  • Firstpage
    78
  • Lastpage
    83
  • Abstract
    LGA sockets are becoming the leading technology to connect the micro-processors with the system boards of desktop or server computers. It is critical to understand the mechanical behavior of a socket to predict its required enabling load and reliability to certain confidence at the design phase. FEA has been used to achieve this goal at both component and system levels. This paper presents a sensitivity study of socket J- lead compliances to the J-lead geometry and element types used to model the J-lead. A methodology to simplify the J-lead structure using binary DOE and optimization is proposed for significant DOF reduction while maintaining the J-lead compliances to be within 10% error. The simplified socket component was later used to develop the complete detailed system model including the socket housing, LGA contact, system board, backing plate and the package with different loading conditions. This model was employed to investigate the interaction between the package and the socket, as well as the package deformation and socket BGA forces under different enabled conditions.
  • Keywords
    electric connectors; electronics packaging; finite element analysis; FEA modeling; LGA contact; LGA sockets; backing plate; mechanical behavior; package deformation; socket BGA forces; socket component; socket housing; system board; Contacts; Deformable models; Electronics packaging; Field emitter arrays; Geometry; Optimization methods; Pins; Power system modeling; Sockets; Springs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2008. Proceedings of the 54th IEEE Holm Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-1901-2
  • Electronic_ISBN
    978-1-4244-1902-9
  • Type

    conf

  • DOI
    10.1109/HOLM.2008.ECP.26
  • Filename
    4694927