• DocumentCode
    1624570
  • Title

    Room temperature desorption of Self Assembly Monolayer (SAM) passivated Cu for lowering the process temperature Cu-Cu bonding of 3-D ICs

  • Author

    Ghosh, T. ; Dutta, Arin ; Lingareddy, E. ; Subrahmanyam, C. ; Singh, S.G.

  • Author_Institution
    Electr. Eng., IIT Hyderabad, Hyderabad, India
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Success of 3-D ICs technology depends upon the reduction of Cu-Cu bonding temperature. Contamination and oxidation of Cu surface is major bottleneck of reduce the bonding temperature. In this study we investigated the passivation property of Self Assembly Monolayer (SAM) by using Alkyl thiol (Hexanethiol, six carbon chain, C6) on freshly deposited Copper surface and thereafter desorption of the monolayer using cold Helium plasma. Protection of Copper surface using SAM will minimize the possibility of forming Copper oxide. Cold plasma desorption will help in getting back the clean and pure Copper surface on room temperature. This will provide the platform for low temperature bonding (<;200°C) for 3D IC technology.
  • Keywords
    bonding processes; desorption; helium; monolayers; passivation; plasma materials processing; self-assembly; three-dimensional integrated circuits; 3-D IC; Cu; Cu-Cu bonding temperature; SAM; alkyl thiol; carbon chain; cold helium plasma; cold plasma desorption; contamination; copper surface protection; hexanethiol; oxidation; passivation property; room temperature desorption; self-assembly monolayer; temperature 293 K to 298 K; Bonding; Plasma temperature; Pollution measurement; Surface treatment; Time measurement; 3-D ICs; Alkyl thiol; Helium plasma; SAM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Electronics (ICEE), 2012 International Conference on
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4673-3135-7
  • Type

    conf

  • DOI
    10.1109/ICEmElec.2012.6636262
  • Filename
    6636262