DocumentCode
1624570
Title
Room temperature desorption of Self Assembly Monolayer (SAM) passivated Cu for lowering the process temperature Cu-Cu bonding of 3-D ICs
Author
Ghosh, T. ; Dutta, Arin ; Lingareddy, E. ; Subrahmanyam, C. ; Singh, S.G.
Author_Institution
Electr. Eng., IIT Hyderabad, Hyderabad, India
fYear
2012
Firstpage
1
Lastpage
4
Abstract
Success of 3-D ICs technology depends upon the reduction of Cu-Cu bonding temperature. Contamination and oxidation of Cu surface is major bottleneck of reduce the bonding temperature. In this study we investigated the passivation property of Self Assembly Monolayer (SAM) by using Alkyl thiol (Hexanethiol, six carbon chain, C6) on freshly deposited Copper surface and thereafter desorption of the monolayer using cold Helium plasma. Protection of Copper surface using SAM will minimize the possibility of forming Copper oxide. Cold plasma desorption will help in getting back the clean and pure Copper surface on room temperature. This will provide the platform for low temperature bonding (<;200°C) for 3D IC technology.
Keywords
bonding processes; desorption; helium; monolayers; passivation; plasma materials processing; self-assembly; three-dimensional integrated circuits; 3-D IC; Cu; Cu-Cu bonding temperature; SAM; alkyl thiol; carbon chain; cold helium plasma; cold plasma desorption; contamination; copper surface protection; hexanethiol; oxidation; passivation property; room temperature desorption; self-assembly monolayer; temperature 293 K to 298 K; Bonding; Plasma temperature; Pollution measurement; Surface treatment; Time measurement; 3-D ICs; Alkyl thiol; Helium plasma; SAM;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Electronics (ICEE), 2012 International Conference on
Conference_Location
Mumbai
Print_ISBN
978-1-4673-3135-7
Type
conf
DOI
10.1109/ICEmElec.2012.6636262
Filename
6636262
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