• DocumentCode
    1624881
  • Title

    Radial analysis of a C/sub 2/F/sub 6/ inductively coupled plasma using optical emission spectroscopy and laser induced fluorescence

  • Author

    Shannon, Steven ; Hebner, G. ; Holloway, James P. ; Brake, Mary L.

  • Author_Institution
    Dept. of Nucl. Eng. & Radiol. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1998
  • Firstpage
    166
  • Abstract
    Summary form only given, as follows. A C/sub 2/F/sub 6/ discharge in a GEC rf reference cell equipped with an inductively coupled source has been analyzed using laser induced fluorescence and spatially resolved optical emission spectroscopy. Experiments were conducted approximately 1 cm above the lower electrode for C/sub 2/F/sub 6/ and C/sub 2/F/sub 6//Ar discharges at pressures ranging from 5 mTorr to 20 mTorr and inductive electrode power ranging from 100 W to 300 W. A 30 W bias was placed on the bottom electrode for all experiments. A 6 inch bare silicon wafer was used to represent processing conditions. A quartz ring was clamped to the top electrode to provide discharge stability. Radial profiles of optical emission were obtained using a novel glow discharge tomography sensor and regularized inversion solver. The 488 nm SiF line and the 703 nm F line were profiled, as well as the 750.4 nm Ar line in the C/sub 2/F/sub 6//Ar runs in order to conduct spatially resolved actinometry of fluorine. Spatially resolved ground state radical density profiles were measured by laser induced fluorescence.
  • Keywords
    organic compounds; 100 to 300 W; 30 W; 488 nm; 5 to 20 mtorr; 703 nm; 750.4 nm; Ar line; F line; GEC RF reference cell; SiF line; bare Si wafer; discharge stability; glow discharge tomography sensor; hexafluoroethane; inductively coupled plasma; laser induced fluorescence; optical emission; optical emission spectroscopy; quartz ring; radial analysis; regularized inversion solver; spatially resolved actinometry; spatially resolved ground state radical density profiles; Argon; Electrodes; Fault location; Fluorescence; Optical coupling; Optical sensors; Silicon; Spatial resolution; Spectroscopy; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
  • Conference_Location
    Raleigh, NC, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-4792-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.1998.677626
  • Filename
    677626