Title :
Comparison of dispatching rules for semiconductor manufacturing using large facility models
Author :
Mittler, Manfred ; Schoemig, Alexander K.
Author_Institution :
IBM, Stuttgart, Germany
fDate :
6/21/1905 12:00:00 AM
Abstract :
We present a comparison of five dispatching rules that aim to reduce the mean and the variance of cycle times. The performance of the dispatch rules is evaluated using simulation results for two large semiconductor wafer fabrication facilities. The results show that which dispatch rule achieves the best results depends on the fab, on the load of the fab and on the product
Keywords :
dispatching; production control; semiconductor device manufacture; stock control; Delphi simulation tool; cycle times; dispatching rules; fab; fabrication facility; inventory control; large facility models; mean; semiconductor manufacturing; semiconductor wafer fabrication; supply chain management; variance; Dispatching; Electric breakdown; Fabrication; Manufacturing processes; Production facilities; Raw materials; Road transportation; Semiconductor device manufacture; Time measurement; Virtual manufacturing;
Conference_Titel :
Simulation Conference Proceedings, 1999 Winter
Conference_Location :
Phoenix, AZ
Print_ISBN :
0-7803-5780-9
DOI :
10.1109/WSC.1999.823197
