MMIC characterization using electro-optic field mapping

Author

Jäger, D. ; David, G.

Author_Institution

FG Optoelektronik, Gerhard-Mercator-Univ. Duisburg, Germany

fYear

1995

Firstpage

41

Lastpage

44

Abstract

It has been demonstrated previously that the technique of direct electro-optic probing can successfully be applied to study two-dimensional electric field distributions in MMICs. As a result, each MMIC component can be characterized by on-wafer and in-circuit measurements up to millimeter wave frequencies. In this paper, experimental results performed on a traveling-wave amplifier are presented as an example. Different MMIC components (interdigitated capacitor and MESFET) are tested in detail and a quantitative comparison with theoretical results is carried out. Coplanar waveguide modes are also studied in detail

Keywords

MESFET integrated circuits; MMIC amplifiers; coplanar waveguides; electric field measurement; field effect MMIC; integrated circuit testing; microwave measurement; millimetre wave measurement; travelling wave amplifiers; 1 to 12 GHz; MESFET; MMIC characterization; MMIC components; electro-optic field mapping; in-circuit measurements; interdigitated capacitor; on-wafer measurements; traveling-wave amplifier; two-dimensional electric field distributions; Capacitors; Circuit testing; Frequency measurement; MESFETs; MMICs; Millimeter wave measurements; Optical amplifiers; Semiconductor optical amplifiers; Spatial resolution; Transmission line theory;

fLanguage

English

Publisher

ieee

Conference_Titel

Signals, Systems, and Electronics, 1995. ISSSE '95, Proceedings., 1995 URSI International Symposium on

Conference_Location

San Francisco

Print_ISBN

0-7803-2516-8

Type

conf

DOI

10.1109/ISSSE.1995.497930

Filename

497930