• DocumentCode
    1625184
  • Title

    A SOM-based dimensionality reduction method for KNN classifiers

  • Author

    Wu, Jiunn-Lin ; Li, I-Jing

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Nat. Chung Hsing Univ., Taichung, Taiwan
  • fYear
    2010
  • Firstpage
    173
  • Lastpage
    178
  • Abstract
    The self-organizing-feature-maps (SOM) algorithm is a typical dimensionality reduction technique. The SOM algorithm adopts neighborhood learning to form a topological ordering among data points. In other words, self-organizing feature maps highly preserve topological relationships in the lower-dimensional space. Using SOM as a feature extraction method for the k nearest neighbor classifier is appropriate, since we always choose k ordered samples in the classification phase. This paper uses self-feature-maps to represent original data sets in a two-dimensional feature space in the learning phase to reduce classification time of the k nearest neighbor classifier. Since the self-organizing feature maps algorithm preserves distance and proximity relationships, our proposed method does not compromise k nearest neighbor classification accuracy, but obtains better k NN classification accuracy in lesser time. This work proposes a weighted-self-organizing feature maps (WSOM) method using a weighted distance of finding the winning neuron step. Experiments with artificial datasets and real datasets verify the proposed method performance. Experimental results show that our proposed algorithm performs the best and is most efficient at the classification phase.
  • Keywords
    feature extraction; pattern classification; self-organising feature maps; statistical analysis; KNN classifiers; dimensionality reduction technique; feature extraction method; neighborhood learning; self organizing feature maps algorithm; Artificial neural networks; Classification algorithms; Iris recognition; dimensionality reduction; multidimensional scaling; nearest neighbor classifier; self organizing feature maps; weighed Euclidean metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Science and Engineering (ICSSE), 2010 International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-6472-2
  • Type

    conf

  • DOI
    10.1109/ICSSE.2010.5551813
  • Filename
    5551813