• DocumentCode
    1625204
  • Title

    Wafer scale architecture for an FFT processor

  • Author

    Jain, V.K. ; Nienhaus, H.A. ; Landis, D.L. ; Al-Arian, A. ; Alvarez, C.E.

  • Author_Institution
    Coll. of Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    1989
  • Firstpage
    453
  • Abstract
    A description is given of research on a WSI FFT processor. Attention is focused on the design methodology, architecture, and sparing strategy and restructuring. The basic cells utilized are the MSA and the coefficient ROM. The wafer thus has only two types of cell, making the algorithm highly suitable for restructable wafer-scale integration (WSI) design. The restructuring algorithm is discussed briefly, and the tradeoffs between cell redundancy, wafer-area utilization, and effective yield are evaluated. Indeed, interest in WSI arises from expectations of higher speed, better reliability, and significant improvement in the circuit density. This FFT wafer represents the first of several envisioned in large-scale signal processing and computing under a DARPA microelectronics project in progress
  • Keywords
    VLSI; digital signal processing chips; fast Fourier transforms; microprocessor chips; read-only storage; DARPA microelectronics project; FFT processor; MSA; WSI FFT processor; architecture; cell redundancy; circuit density; coefficient ROM; design methodology; effective yield; large-scale signal processing; reliability; restructable wafer-scale integration; sparing strategy; speed; wafer-area utilization; Adders; Automatic testing; Circuit testing; Equations; Flow graphs; Large-scale systems; Microelectronics; Read only memory; Signal processing algorithms; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1989., IEEE International Symposium on
  • Conference_Location
    Portland, OR
  • Type

    conf

  • DOI
    10.1109/ISCAS.1989.100388
  • Filename
    100388