DocumentCode :
1625437
Title :
A n-state time-domain measurement test-bench for characterization of intermodulation distortion on device level
Author :
Merkle, T. ; Ramberger, S. ; Kuri, M. ; van Raay, F.
Author_Institution :
Fraunhofer Inst. for Appl. Solid-State Phys., Freiburg, Germany
Volume :
3
fYear :
2003
Firstpage :
1643
Abstract :
A flexible nonlinear measurement system is presented for the investigation of intermodulation distortion (IMD) on device level at Ka-band frequencies. The setup is unique in the way that a passive load-pull tuner embedded inside a full two-port test-set is combined with a hybrid receiver to one fully automated test system. The calibration problem of the resulting n-state test-set is formulated with a generalized 4-port error model, for the first time. The hybrid receiver is composed of a virtual 4 channel time-domain sampling oscilloscope and a spectrum analyzer. As an application, we show various two-tone sweep-scenarios applied to our GaAs HEMTs targeting high power applications at Ka-band frequencies.
Keywords :
automatic test equipment; calibration; distortion measurement; intermodulation distortion; microwave measurement; time-domain analysis; GaAs; GaAs power HEMT; Ka-band; automated test system; calibration; four-port error model; hybrid receiver; intermodulation distortion; n-state time-domain measurement test-bench; nonlinear measurement system; passive load-pull tuner; spectrum analyzer; two-port test-set; two-tone swept signal; virtual four-channel time-domain sampling oscilloscope; Automatic testing; Calibration; Distortion measurement; Frequency measurement; Intermodulation distortion; Power system modeling; Sampling methods; System testing; Time domain analysis; Tuners;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7695-1
Type :
conf
DOI :
10.1109/MWSYM.2003.1210453
Filename :
1210453
Link To Document :
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