Title :
A new plasma source for photoresist ash and residue removal
Author :
SRIVASTAVA, ANURAG K. ; Pingree, R. ; Ferris, David
Author_Institution :
Eaton Corp., Rockville, MD, USA
Abstract :
Summary form only given. A new microwave driven (2.45 GHz) plasma source has been developed at Fusion Systems Division of the Eaten Corporation´s Semiconductor Equipment Operation, to be used as a downstream asher. It operates by exciting the TM/sub 012/ resonant microwave mode in a cylindrical cavity structure. The source consists of an internally tuned microwave cavity that dynamically adjusts the cavity dimensions to match all changes in the plasma impedance. This is accomplished by a sliding short, and adjustable antenna lengths. Internal tuning ensures maximum power input to the plasma for all operating conditions by minimizing reflected power to less than 1% over a large operating window. Due to its novel internal tuning mechanism, there is no need for any external matching network, and therefore negligible power is lost to this internal matching unit. The plasma is totally contained in a dielectric tube running through the length of the cylindrical microwave cavity and is transported downstream for ashing.
Keywords :
lithography; photoresists; plasma applications; plasma production; surface chemistry; surface cleaning; TM/sub 012/ resonant microwave mode; adjustable antenna lengths; cylindrical microwave cavity structure; dielectric tube; downstream asher; external matching network; internal tuning; internal tuning mechanism; internally tuned microwave cavity; microwave driven plasma source; operating conditions; operating window; photoresist ash removal; photoresist residue removal; power input; reflected power; sliding short; Ash; Atomic measurements; Microwave devices; Plasma applications; Plasma sources; Plasma transport processes; Radio frequency; Resists; Resonance; Tuning;
Conference_Titel :
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
Conference_Location :
Raleigh, NC, USA
Print_ISBN :
0-7803-4792-7
DOI :
10.1109/PLASMA.1998.677650