Test slice difference technique for low power encoding

In this paper, we present a low power strategy for test data compression that is called ldquobreak-independent-table (BIT) encodingrdquo. In addition, we present a new decompression scheme for test vectors that is called ldquotest slice difference techniquerdquo to solve huge test data volume that must be stored in the tester memory. About how reducing power dissipation problem, we present an extremely efficient algorithm for scan chain reordering. Experimental results for several large ISCASpsila89 benchmark circuits show that the proposed scheme achieved higher compression ratio than previous approach, and the power consumption is also significantly reduction simultaneously.