Title :
Performance of polygonal-shaped TFBARs and on-wafer tuning inductors
Author :
Jong-Soo Kim ; Kun-Wook Kim ; Myeong-Gweon Gu ; Jong-Gwan Yook ; Han-Kyu Park
Author_Institution :
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
In this paper, two different shapes of thin film bulk acoustic resonators (TFBARs) are characterized with respect to electrode thickness and overall area, and gold plated on-wafer inductors are employed to tune the TFBAR filter performance. Air-gap type TFBARs are fabricated with aluminum nitride (AlN) as a piezoelectric material and platinum as top and bottom electrodes. An equivalent inductor model is employed for the tuning of fabricated TFBAR bandpass filters, designed based on the modified Butterworth-Van Dyke (MBVD) equivalent circuit. Fabricated inductors revealed inductance of 3 nH and Q factor of about 8 at 2 GHz. It is clearly shown that tuning inductors can enlarge the bandwidth of the TFBAR ladder filters by about 10 MHz and suppress the out-of-band rejection around 10 dB further.
Keywords :
Butterworth filters; Q-factor; UHF filters; acoustic resonator filters; band-pass filters; bulk acoustic wave devices; circuit tuning; equivalent circuits; integrated circuit design; integrated circuit measurement; integrated circuit modelling; ladder filters; thin film inductors; 2 GHz; AlN; Butterworth-Van Dyke equivalent circuits; MBVD; Pt-Au-AlN; Q factor; TFBAR bandpass filter tuning; UHF filters; air-gap type TFBAR; aluminum nitride piezoelectric materials; electrode thickness; equivalent inductor models; gold plated on-wafer tuning inductors; inductor inductance; ladder filters bandwidth increase; out-of-band rejection suppression; platinum electrodes; polygonal-shaped TFBAR; resonator filters; resonator overall area; thin film bulk acoustic resonators; Air gaps; Band pass filters; Circuit optimization; Electrodes; Film bulk acoustic resonators; Gold; Piezoelectric films; Resonator filters; Shape; Thin film inductors;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1210480