DocumentCode
1626102
Title
Janus: A novel use of Formal Verification for targeted behavioral equivalence
Author
Math, Prakash ; Hoenig, David
Author_Institution
Intel Corp., Hillsboro, OR
fYear
2008
Firstpage
64
Lastpage
70
Abstract
We present a novel way of using a formal verification (FV) framework to establish targeted behavioral equivalence between two similar designs. The new verification framework is generic and can be applied to a wide range of behavioral equivalence problems, such as ensuring late logic changes preserve earlier design intent and do not introduce new flaws. The new framework analyzes two similar designs that may have significant microarchitectural, implementation, or behavioral differences between them. If there is a targeted set of behaviors that are required to be preserved between these two designs, then the verification framework can be used to establish the behavioral equivalence. The new framework combines the strengths of FV and the formal equivalence verification (FEV) flows in a fully automated method to establish the behavioral equivalence. This method was used on one of the next generation Intelreg microprocessor to verify that design changes for a new microarchitecture feature did not create flaws or unintended behaviors (no-harm) in other parts of the design when that feature was disabled. Three complex design flaws (bugs) were found during the process. After the framework was developed, the verification effort took less than two weeks to complete which was dramatically less effort than if we had used traditional validation methods.
Keywords
formal verification; microprocessor chips; Intel microprocessor; Janus; behavioral equivalence problems; formal equivalence verification; formal verification; microarchitecture feature; similar design; Computer bugs; Design optimization; Formal specifications; Formal verification; Job design; Logic design; Microarchitecture; Microprocessors; Process design; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
High Level Design Validation and Test Workshop, 2008. HLDVT '08. IEEE International
Conference_Location
Incline Village, NV
ISSN
1552-6674
Print_ISBN
978-1-4244-2922-6
Type
conf
DOI
10.1109/HLDVT.2008.4695876
Filename
4695876
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