• DocumentCode
    1626491
  • Title

    A physically-based continuous analytical graded-channel SOI nMOSFET model for analog applications

  • Author

    Pavanello, Marcelo Antonio ; Iniguez, B. ; Martino, Joao Antonio ; Flandre, Denis

  • Author_Institution
    Center for Semicond. Components, State Univ. of Campinas, Brazil
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Abstract
    In this work a continuous model for analog simulation of long-channel Graded-Channel (GC) Silicon-On-Insulator (SOI) nMOSFETs is presented. The model is based in a series association of two conventional fully-depleted (FD) SOI nMOSFETs with different characteristics, representing each part of the GC nMOSFET channel region. MEDICI numerical bidimensional simulations and experimental results are used to validate the proposed model.
  • Keywords
    MOSFET; semiconductor device models; silicon-on-insulator; MEDICI two-dimensional numerical simulation; analog simulation; continuous analytical model; fully-depleted transistor; graded-channel SOI nMOSFET; Analytical models; Capacitance; Doping; MOSFET circuits; Numerical simulation; Semiconductor films; Semiconductor process modeling; Silicon on insulator technology; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE International Caracas Conference on
  • Print_ISBN
    0-7803-7380-4
  • Type

    conf

  • DOI
    10.1109/ICCDCS.2002.1004044
  • Filename
    1004044