Title :
CMOS kink effect-induced instability in Al/AlOx single electron transistors
Author :
Prager, Aaron A. ; George, Hubert C. ; Orlov, Alexei O. ; Snider, Gregory L.
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
Abstract :
We present an examination of single electron transistor instability resulting from the presence of CMOS devices co-located on the same silicon substrate. This instability may impact future attempts to integrate single electron devices with CMOS circuits.
Keywords :
CMOS integrated circuits; aluminium compounds; single electron transistors; stability; Al-AlOx; CMOS devices; CMOS kink effect-induced instability; single electron transistors; CMOS integrated circuits; Gallium nitride; Inverters; Transistors;
Conference_Titel :
Device Research Conference (DRC), 2010
Conference_Location :
South Bend, IN
Print_ISBN :
978-1-4244-6562-0
Electronic_ISBN :
1548-3770
DOI :
10.1109/DRC.2010.5551862
