DocumentCode :
1626529
Title :
A fast detection algorithm suitable for mitigation of numerous power quality disturbances
Author :
Montero-hernández, Oscar C. ; Enjeti, Prasad N.
Author_Institution :
Power Electron. Lab., Texas A&M Univ., College Station, TX, USA
Volume :
4
fYear :
2001
Firstpage :
2661
Abstract :
In this paper, a fast detection method for voltage disturbances is explored. The proposed method provides reliable and fast detection for single-phase and poly-phase voltage disturbances such as voltage sags, voltage swells, flicker and frequency change in the utility voltage. The algorithm is based on the theory that allows a set of three-phase voltages be represented as DC voltages in a d-q synchronous rotating frame. In this case, the utility input voltages are sensed and then converted to DC quantities in the d-q reference frame. Thus, any disturbance at the utility input voltages will be reflected as disturbances in the d-q values. Further processing of the signals minimized the point-on-wave effect and yields an output signal indicating if the disturbance is a voltage sag or a voltage swell. Analysis, simulation and experimental results are presented for a variety of disturbances on a three-phase system. The proposed algorithm is implemented on a DSP based system to provide ride-through for critical loads.
Keywords :
fault diagnosis; power supply quality; power system faults; power system transients; DC voltages; critical load ride-through; d-q reference frame; d-q synchronous rotating frame; fast detection algorithm; flicker; frequency change; point-on-wave effect; poly-phase voltage disturbances; power quality disturbances mitigation; single-phase voltage disturbances; three-phase voltages; voltage sags; voltage swells; Detection algorithms; Digital signal processing; Information technology; Laboratories; Power electronics; Power quality; Signal processing; Signal processing algorithms; Uninterruptible power systems; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-7114-3
Type :
conf
DOI :
10.1109/IAS.2001.955994
Filename :
955994
Link To Document :
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