Title : 
Survival of VLSI design - coping with device variability and uncertainty
         
        
        
            Author_Institution : 
VLSI Systems, IBM Austin Research Laboratory, Austria
         
        
        
        
        
            Abstract : 
◆ Trends/Challenges ■ Variability increasing as Design/Manufacturing interface complexity rising. ◆ More design rules, more 2nd order effects, more systematic variations, more correction steps... ■ Current techniques are insufficient ◆ Abstractions no longer good enough ◆ Predictability is poor ■ Ability to confidently bound performance is degrading. ■ Frequent model/hardware mismatch. ◆ Required Action ■ Better, targeted measurements through characterization structures ■ Hardware-driven variation-enabled modeling ◆ Corners not sufficient any more - statistical timing ■ Technology aware circuit and PD tools ◆ Variation tolerance in design ◆ Technology aware physical design, redundancy, adaptation.
         
        
            Keywords : 
Circuits; Current measurement; Degradation; Hardware; Predictive models; Redundancy; Timing; Uncertainty; Very large scale integration; Virtual manufacturing;
         
        
        
        
            Conference_Titel : 
Circuits and Systems Workshop: System-on-Chip - Design, Applications, Integration, and Software, 2008 IEEE Dallas
         
        
            Conference_Location : 
Richardson, TX, USA
         
        
            Print_ISBN : 
978-1-4244-2955-4
         
        
            Electronic_ISBN : 
978-1-4244-2956-1
         
        
        
            DOI : 
10.1109/DCAS.2008.4695909