• DocumentCode
    1626888
  • Title

    A Framework for Automatic Clustering of Parametric MIMO Channel Data Including Path Powers

  • Author

    Czink, Nicolai ; Cera, Pierluigi ; Salo, Jari ; Bonek, Ernst ; Nuutinen, Jukka-Pekka ; Ylitalo, Juha

  • Author_Institution
    Inst. fur Nachrichtentechnik und Hochfrequenztech., Tech. Univ. Wien, Vienna
  • fYear
    2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We present a solution to the problem of identifying clusters from MIMO measurement data in a data window, with a minimum of user interaction. Conventionally, visual inspection has been used for the cluster identification. However this approach is impractical for a large amount of measurement data. Moreover, visual methods lack an accurate definition of a "cluster" itself. We introduce a framework that is able to cluster multi-path components (MPCs), decide on the number of clusters, and discard outliers. For clustering we use the K-means algorithm, which iteratively moves a number of cluster centroids through the data space to minimize the total difference between MPCs and their closest centroid. We significantly improve this algorithm by following changes: (i) as the distance metric we use the multi- path component distance (MCD), (ii) the distances are weighted by the powers of the MPCs. The implications of these changes result in a definition of a "cluster" itself that appeals to intuition. We assess the performance of the new algorithm by clustering real-world measurement data from an indoor big hall environment.
  • Keywords
    MIMO communication; multipath channels; pattern clustering; wireless channels; K-means algorithm; MIMO measurement data; automatic clustering; multipath component distance; multipath components clustering; parametric channel data; path powers; Automatic testing; Azimuth; Clustering algorithms; Delay; Inspection; Iterative algorithms; Laboratories; MIMO; Solid modeling; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 2006. VTC-2006 Fall. 2006 IEEE 64th
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    1-4244-0062-7
  • Electronic_ISBN
    1-4244-0063-5
  • Type

    conf

  • DOI
    10.1109/VTCF.2006.35
  • Filename
    4109300