Title : 
Reducing Symbol Loss Probability in the Downlink of an OFDMA Based Wireless Network
         
        
            Author : 
Yazdi, Amin Alamdar ; Sorour, Sameh ; Valaee, Shahrokh ; Kim, Ronny Yongho
         
        
            Author_Institution : 
ECE Dept., Univ. of Toronto, Toronto, ON
         
        
        
        
        
            Abstract : 
This paper studies the problem of minimizing symbol loss probability while keeping the system throughput above a certain threshold in downlink transmission of future OFDMA based wireless networks that rely on imperfect one-bit channel state feedback. To solve this problem, we study different preceding classes and propose a new class of preceding matrices that can gain a better result. This work is different from previous OFDM preceding literature in two main aspects. First, it addresses a more practical case where one-bit channel state feedback is available at the base station. Second, it compares precoding classes and proposes a new one. We prove analytically that our proposed precoding class has a lower symbol loss probability than the existing classes. Numerical evaluations show that a large gain in symbol loss probability is achieved by our class in comparison with the other classes.
         
        
            Keywords : 
OFDM modulation; feedback; matrix algebra; precoding; probability; radio links; radio networks; wireless channels; downlink OFDM transmission; imperfect one-bit channel state feedback; preceding matrix; precoding class; symbol loss probability; wireless network; Base stations; Communications Society; Downlink; Error probability; OFDM; Propagation losses; State feedback; Throughput; Tin; Wireless networks;
         
        
        
        
            Conference_Titel : 
Communications, 2008. ICC '08. IEEE International Conference on
         
        
            Conference_Location : 
Beijing
         
        
            Print_ISBN : 
978-1-4244-2075-9
         
        
            Electronic_ISBN : 
978-1-4244-2075-9
         
        
        
            DOI : 
10.1109/ICC.2008.655