• DocumentCode
    162719
  • Title

    Prediction of software defects using Twin Support Vector Machine

  • Author

    Agarwal, Sankalp ; Tomar, Divya ; Siddhant

  • Author_Institution
    Indian Inst. of Inf. Technol., Allahabad, India
  • fYear
    2014
  • fDate
    1-2 March 2014
  • Firstpage
    128
  • Lastpage
    132
  • Abstract
    Considering the current scenario, the crucial need for software developer is the generous enhancement in the quality of the software product we deliver to the end user. Lifecycle models, development methodologies and tools have been extensively used for the same but the prime concern remains is the software defects that hinders our desire for good quality software. A lot of research work has been done on defect reduction, defect identification and defect prediction to solve this problem. This research work focus on defect prediction, a fairly new filed to work on. Artificial intelligence and data mining are the most popular methods researchers have been using recently. This research aims to use the Twin Support Vector Machine (TSVM) for predicting the number of defects in a new version of software product. This model gives a nearly perfect efficiency which compared to other models is far better. Twin Support Vector Machine based software defects prediction model using Gaussian kernel function obtains better performance as compare to earlier proposed approaches of software defect prediction. By predicting the defects in the new version, we thereby attempt to take a step to solve the problem of maintaining the high software quality. This proposed model directly shows its impact on the testing phase of the software product by simply plummeting the overall cost and efforts put in.
  • Keywords
    Gaussian processes; data mining; program testing; software product lines; software quality; support vector machines; Gaussian kernel function; TSVM; artificial intelligence; data mining; defect identification; defect prediction; lifecycle models; software developer; software development methodologies; software product quality; software product testing; twin support vector machine based software defect prediction model; Equations; Kernel; Mathematical model; Predictive models; Software measurement; Support vector machines; CM1 dataset; Software defect; Software defects prediction; Twin Support Vector Machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Systems and Computer Networks (ISCON), 2014 International Conference on
  • Conference_Location
    Mathura
  • Print_ISBN
    978-1-4799-2980-1
  • Type

    conf

  • DOI
    10.1109/ICISCON.2014.6965232
  • Filename
    6965232