Title :
Next Generation Lab-a solution for remote characterization of analog integrated circuits
Author :
Wulff, Carsten ; Ytterdal, Trond ; Saethre, Thomas Aas ; Skjelvan, Arne ; Fjeldly, Tor A. ; Shur, Michael S.
Author_Institution :
Dept. of Phys. Electron., Norwegian Inst. of Technol., Trondheim, Norway
fDate :
6/24/1905 12:00:00 AM
Abstract :
In this paper, we describe the development and use of a remotely operated laboratory based on Microsoft .NET technology. The Next Generation Lab combines the latest in Web technology with standard industrial instruments to make a cost effective solution for education in the field of analog CMOS integrated circuits.
Keywords :
CMOS analogue integrated circuits; Internet; computer aided instruction; electronic engineering computing; electronic engineering education; integrated circuit measurement; internetworking; virtual instrumentation; Microsoft .NET technology; Next Generation Lab; Web technology; analog CMOS integrated circuits; cost effectiveness; education; remote characterization; remotely operated laboratory; standard industrial instruments; Analog integrated circuits; CMOS technology; Costs; Educational institutions; Instruments; Integrated circuit technology; Remote laboratories; Semiconductor devices; Web services; Workstations;
Conference_Titel :
Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE International Caracas Conference on
Print_ISBN :
0-7803-7380-4
DOI :
10.1109/ICCDCS.2002.1004081
