Title :
VDDQ: a built-in self-test scheme for analog on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard
Author :
Acevedo, Gladys Omayra Ducoudray ; Ramirez-Angulo, Jaime
Author_Institution :
Klipsch Sch. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
Abstract :
An innovative self-diagnostic method called VDDQ is presented. The proposed method is compliant with the IEEE 1149.4 mixed-signal test bus standard. It performs a pass or fail function of the analog circuit. The VDDQ method sequentially senses the quiescent voltage of several nodes on the circuit under test (CUT) and compares them with their nominal value. The method produces a 10 bit digital vector, with nodal information including a pass or fail flag, plus the analog voltage sensed. Simulation results are provided for the flag and amplifier circuit used for the design of the testing circuit. Through simulations, this testing scheme has performed a test per node every millisecond. This will potentially allow a defect free IC to enter the market in significantly less time than with conventional testing methods.
Keywords :
IEEE standards; analogue integrated circuits; built-in self test; circuit simulation; integrated circuit testing; 10 bit; IEEE 1149.4 mixed-signal test bus standard compliance; VDDQ built-in self-test scheme; VDDQ method; amplifier circuit; analog circuit fail function; analog circuit pass function; analog on-chip diagnosis; circuit under test; defect free IC; digital vector; nodal information simulation; quiescent voltage; self-diagnostic method; simulations; test per node; testing circuit; testing methods; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Integrated circuit testing; Manufacturing; Sequential analysis; Voltage;
Conference_Titel :
Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE International Caracas Conference on
Conference_Location :
Oranjestad, Aruba, Netherlands
Print_ISBN :
0-7803-7380-4
DOI :
10.1109/ICCDCS.2002.1004083
