Title :
Characterisation of microcontroller susceptibility to radio frequency interference
Author :
Baffreau, S. ; Bendhia, S. ; Ramdani, Mohammed ; Sicard, E.
Author_Institution :
Inst. Nat. des Sci. Appliquees, Toulouse, France
fDate :
6/24/1905 12:00:00 AM
Abstract :
Work in the field of electromagnetic compatibility (EMC), generally concentrating on noise and interference at electronic systems, has recently focused more attention on integrated circuits (ICs). In this work, we mainly focus on immunity of programmable devices to radio frequency interference (RFI). This paper presents various kinds of RFI and how it can be coupled to a digital signal processor (DSP) or micro-controller. A new approach for immunity measurement is introduced and some ways to improve embedded software are proposed.
Keywords :
PLD programming; digital signal processing chips; electromagnetic compatibility; firmware; integrated circuit measurement; integrated circuit noise; microcontrollers; microprogramming; programmable circuits; radiofrequency interference; DSP; EMC; digital signal processor; electromagnetic compatibility; electronic systems; embedded software; immunity measurement; integrated circuits; interference; microcontroller RFI susceptibility; noise; programmable device RFI immunity; radio frequency interference; Coupling circuits; Digital signal processing; Digital signal processors; Electromagnetic compatibility; Electromagnetic compatibility and interference; Integrated circuit measurements; Integrated circuit noise; Microcontrollers; Radiofrequency interference; Software measurement;
Conference_Titel :
Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE International Caracas Conference on
Print_ISBN :
0-7803-7380-4
DOI :
10.1109/ICCDCS.2002.1004088
